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Chinese Chinese Products Equipment Series Equipment Series Unpatterned Wafer Defect Inspection Equipment Series Patterned Wafer Defect Inspection Equipment Series Metrology Equipment Series Overlay Metrology Equipment Series 3D Surface Profiling Metrology Equipment Series Dielectric Film Metrology Equipment Series Software series Software Yield Management System DMS/YMS Semiconductor Auto Defect Classification System Skyverse Company Introduction Development History Corporate Culture Certificates of Honor News News Recruitment Social Recruitment Campus Recruitment Contact Investor Relations Semiconductor Auto Defect Classification System EAGLE Home > Products > Software Product Introduction Product Features 1.Customizable: Customized Output For 2D And 3D Mapping/Sinf. 2.Auto Task Distribution: Automatically Process Wafers Completed By AOI Machine. 3.Administration Mechanism: Different Managers Have Different Permissions. 4.Statistical Analysis: Support Statistical Analysis Of Various Defect Category.   Previous Product Yield Management System DMS/YMS IVY Next Product Null Products Equipment Series Software series Skyverse Company Introduction Development History Corporate Culture Certificates of Honor News News Recruitment Social Recruitment Campus Recruitment Contact Investor Relations All rights reserved. Infringement will be investigated. 粤ICP备16055877号 WeChat QR Code -->